Although this book deals , in the main , with the now well established techniques of analysis in conventional tem , a brief treatment is also given of further techniques of defect analysis such as high voltage electron microscopy ( hvem ) and scanning transmission electron microscopy ( stem ) this treatment is by no means detailed but is included to show that the subject is still developing in an exciting and challenging way 雖然這本書主要講述目前公認(rèn)的常規(guī)tem分析技術(shù),對(duì)于進(jìn)一步的缺陷分析技術(shù)比如高壓電子顯微鏡( hvem )和透射電子顯微鏡法( stem )的簡單的處理也是有的,但是這種處理并不詳盡,只是列舉了在令人振奮和富有挑戰(zhàn)性的發(fā)展中課題中暴露出來的問題。